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Courses taught by Dr. Kim
MSE 5304. ANALYSIS OF MATERIALS (2-3)
Theoretical understandings and practical applications of various
characterization techniques to materials analysis, ranging from x-rays
and electron diffraction, x-ray spectroscopy, and surface topography,
are discussed. Practice of these techniques in lab class typically
includes SEM spectroscopy, powder diffraction, Laue diffraction, and the
double crystal x-ray diffraction.
Prerequisite: permission of instructor.
MSE 5336. ELECTRICAL PROPERTIES OF
MATERIALS (3-0)
Advanced discussion of electronic structure, transport mechanisms in
metals, semiconductors and superconductors, with applications to
materials used in various electronic devices.
Prerequisite: MSE 5305 or permission of instructor.
MSE 5341. TRANSMISSION ELECTRON
MICROSCOPY IN MATERIALS SCIENCE (3-0)
Crystallography, stereographic projections, and reciprocal lattice.
Specimen preparation in transmission electron microscopy. Dynamical and
kinematical theories of electron diffraction. Interpretation of
diffraction patterns and transmission electron micrographs. Use of the
transmission electron microscope.
Prerequisite: MSE 5304, MSE 5305 or permission of
instructor.
MSE 5141. TRANSMISSION ELECTRON
MICROSCOPY LAB (0-1)
Specimen preparation. Operation of the transmission electron microscope.
Beam alignment and rotation calibration. Bright field and dark field
imaging. Weak beam imaging. Examination of defects.
Prerequisite: MSE 5300, MSE 5304, and permission of
instructor. Co-requisite: MSE 5341.
© 2005 The University of Texas at Arlington
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